Bruker® MPA II FT-NIR Analyzer
Contact Us
Please complete the form, and we will contact you within one business day.
SKU
3013003
Product Details
The possibilities are endless, and due to the modular design of the MPA II, this instrument can easily be adapted to your needs. The robustness of the instrument allows for it to be used in the laboratory and on the factory floor. It can even be placed on a utility cart for mobile applications. This analyzer incorporates state-of-the-art optical parts for outstanding performance and stability:
• Long-life light source for enhanced robustness and reduced maintenance costs.
• Durable, solid state laser for highest wavenumber accuracy.
• Permanently aligned RockSolid™ interferometer, equipped with gold-coated, cube-corner mirrors for consistent high-quality results, less downtime, and highest stability.
• High-sensitivity InGaAs detectors with linear response over the complete wavenumber range for highest accuracy and reproducibility.
• All optical components installed in the MPA II are permanently monitored by the online diagnostic system, which makes sure that your spectrometer operates correctly. Whenever a component is out of specification, the user is notified immediately.
The main benefit of FT-NIR spectroscopy is its versatility and ease of use. It is a fast and precise tool for the non-destructive analysis of liquid, solid, and semi-solid materials, saving costs by reducing time and reagent use. It has largely replaced a number of wet chemical analysis methods in all types of industries including the food and feed industry, as well as the chemical and pharmaceutical industry. The major application areas for the MPA II in the food and feed industry include dairy and meat, beverages, edible oils, bakery ingredients, and condiments as well as grains, seeds, feed, and forage. Use FT-NIR to effectively and cost-efficiently solve a huge variety of application tasks in the pharmaceutical and cosmetics industry, including raw material ID, tablet testing and monitoring drying, or blending processes. FT-NIR technology is widely used in a variety of chemical industries, including the petrochemical and polymer industry. The high information content in NIR spectra, measured in a few seconds, allows the simultaneous analysis of different components and system parameters with high-precision.
• Long-life light source for enhanced robustness and reduced maintenance costs.
• Durable, solid state laser for highest wavenumber accuracy.
• Permanently aligned RockSolid™ interferometer, equipped with gold-coated, cube-corner mirrors for consistent high-quality results, less downtime, and highest stability.
• High-sensitivity InGaAs detectors with linear response over the complete wavenumber range for highest accuracy and reproducibility.
• All optical components installed in the MPA II are permanently monitored by the online diagnostic system, which makes sure that your spectrometer operates correctly. Whenever a component is out of specification, the user is notified immediately.
The main benefit of FT-NIR spectroscopy is its versatility and ease of use. It is a fast and precise tool for the non-destructive analysis of liquid, solid, and semi-solid materials, saving costs by reducing time and reagent use. It has largely replaced a number of wet chemical analysis methods in all types of industries including the food and feed industry, as well as the chemical and pharmaceutical industry. The major application areas for the MPA II in the food and feed industry include dairy and meat, beverages, edible oils, bakery ingredients, and condiments as well as grains, seeds, feed, and forage. Use FT-NIR to effectively and cost-efficiently solve a huge variety of application tasks in the pharmaceutical and cosmetics industry, including raw material ID, tablet testing and monitoring drying, or blending processes. FT-NIR technology is widely used in a variety of chemical industries, including the petrochemical and polymer industry. The high information content in NIR spectra, measured in a few seconds, allows the simultaneous analysis of different components and system parameters with high-precision.